منابع مشابه
Electrostatic-free piezoresponse force microscopy
Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic effect often hinders accurate measurements. Thus, it is very important to quantify as well as remove...
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The multilevel summation method (MSM) offers an efficient algorithm utilizing convolution for evaluating long-range forces arising in molecular dynamics simulations. Shifting the balance of computation and communication, MSM provides key advantages over the ubiquitous particle–mesh Ewald (PME) method, offering better scaling on parallel computers and permitting more modeling flexibility, with s...
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We present the implementation of dynamic electrostatic force microscopy in liquid media. This implementation enables the quantitative imaging of local dielectric properties of materials in electrolyte solutions with nanoscale spatial resolution. Local imaging capabilities are obtained by probing the frequency-dependent and ionic concentration-dependent electrostatic forces at high frequency (>1...
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Assembly is a fundamental issue in the volume production of products that include microscopic (submillimeter) parts. These parts are often fabricated in parallel at high density but must then be assembled into patterns with lower spatial density. In this paper we propose a new approach to microassembly using 1) ultrasonic vibration to eliminate friction and adhesion, and 2) electrostatic forces...
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ژورنال
عنوان ژورنال: Journal of Electromagnetic Analysis and Applications
سال: 2014
ISSN: 1942-0730,1942-0749
DOI: 10.4236/jemaa.2014.610026